Transmission electron microscopy methods for materials science - MC260P151

• Anglický název: Transmission electron microscopy methods for materials science
• Český název: Metody transmisní elektronové mikroskopie pro materiálové vědy
• Zajišťuje: Katedra fyzikální a makromol. chemie (31-260)
• Fakulta: Přírodovědecká fakulta
• Platnost: od 2025
• Semestr: letní
• E-Kredity: 3
• Způsob provedení zkoušky: letní s.:ústní
• Rozsah, examinace: letní s.:1/1, Z+Zk [HT]
• Počet míst: neomezen
• Minimální obsazenost: neomezen
• 4EU+: ne
• Virtuální mobilita / počet míst pro virtuální mobilitu: ne
• Stav předmětu: vyučován
• Jazyk výuky: angličtina
• Poznámka: povolen pro zápis po webu
• Garant: Michal Mazur, Ph.D.
• Vyučující: Michal Mazur, Ph.D.

Anotace

This course will cover the fundamentals of transmission electron microscopy (TEM) in materials sciences.
Graduating this course, students will be able to understand research where TEM has been used and have the
necessary theoretical basis for taking a practical training on the TEM (which is also a part of this course).

TEM provides access to structural and chemical information from the micrometer to the sub-angstrom scale.
Sample can be analyzed towards the crystallinity, grain structure, size, and defects, and the chemical composition.
The crystal lattice can be imaged with atomic resolution, allowing observation of grain boundaries and interfaces. It
is one of the most direct structural analysis methods for studying nanoparticles. A comprehensive introduction to
transmission electron microscopy will be supplemented with practical exercise on use of the microscope, data
processing, and image analysis.

Course level and audience:
The course is designed to provide a comprehensive introduction to TEM methods and is suitable for students at all levels —
Bachelor’s (BSc), Master’s (MSc), and Doctoral (PhD) — who wish to gain a solid grounding in the principles
and applications of TEM in materials science.

Recommended background: Basics of crystallography and diffraction, more advanced crystallography and solid-
state physics are of advantage.

Poslední úprava: Mazur Michal, Ph.D. (19.02.2026)

Podmínky zakončení předmětu

Single-choice test consisting of 30 questions based on the material covered by the lectures

(60% right answers in a pass grade) followed by oral exam in the scope of the subject. The exam

takes place in present form.

Poslední úprava: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)

Literatura

[1] Transmission Electron Microscopy: A Textbook for Materials Science. Authors: Williams, David B. and

Carter, C. Barry. https://www.springer.com/gp/book/9780387765006

[2] Transmission Electron Microscopy: Physics of Image Formation; Authors: Reimer, Ludwig, Kohl,

Helmut. http://www.springer.com/us/book/9780387400938

Poslední úprava: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)

Požadavky ke zkoušce

Successful completion of the course requires passing a single-choice written test consisting of 30 questions based on the material covered in the lectures. A minimum score of 60% correct answers is required to pass the written part.

After passing the test, students must complete an oral examination covering both theoretical and practical aspects of the subject. The oral exam includes practical work at the transmission electron microscope — performing basic measurements on a sample and answering questions related to the instrument’s construction and operational capabilities.

Both the written test and the oral examination are conducted in person.

Poslední úprava: Mazur Michal, Ph.D. (19.02.2026)

Sylabus

Sylabus:

1. Introduction

2. History of TEM

3. Lens aberrations

4. TEM machine

5. Diffraction

6. Reciprocal lattice

7. Scattering

8. Dynamical effects

9. Image formation

10. Pahe contrast, Z-contrast

11. HRTEM

12. STEM

13. ED methods

14. cRED

15. Use of TEM methods for your research

Poslední úprava: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)

Vstupní požadavky

There are no prerequisite subjects required for enrolment in this course. All necessary theoretical foundations will be covered during the lectures.

Course level and audience:
The course is designed to provide a comprehensive introduction to TEM methods and is suitable for students at all levels — Bachelor’s (BSc), Master’s (MSc), and Doctoral (PhD) — who wish to gain a solid grounding in the principles and applications of TEM in materials science.

Recommended background:
Students are encouraged to have a basic understanding of crystallography and diffraction. Prior knowledge of more advanced crystallography or solid-state physics is advantageous but not mandatory.

Poslední úprava: Mazur Michal, Ph.D. (19.02.2026)