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Last update: T_KVOF (22.05.2003)
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Last update: T_KVOF (22.05.2003)
Pelant I.a kol.:Fyzikální praktikum III, Optika, Karolinum 2001 Brož a kol.: Základy fyzikálních měření I,II, SPN 1967
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Last update: T_KVOF (22.05.2003)
Measurement of fundamental parameters of optical system Measurement of refraction index by refractometers Malus' law Rotation of polarization-plane Birefringence in liquid Grating spectroscope Measurement of wavelength by interferometer Construction of Michelson interferometer Study of diffraction in laser beam Study of semiconductors optics elements Malus' law Measurement of refraction index of glasses and liqudes Study of semiconductor Diod Laser ATOMIC PHYSICS Properties of X- ray Study of photoelectric effect. Measurement of the Planck-constant. Ionisation and resonance potentials of mercury, Franck-Hertz experiment. Study of nuclear decay statistic event by the Geiger-Mueller detector.
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