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Last update: T_UCJF (21.05.2001)
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Last update: doc. Mgr. Milan Krtička, Ph.D. (10.06.2019)
Složení ústní zkoušky. |
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Last update: doc. RNDr. Anna Macková, Ph.D. (21.01.2019)
1. Tirira J., Serruys Y., Trocellier P.: Forward recoil spectrometry, Plenum Press, New York 1996. Feldman L.C., Mayer J.W.: Fundamentals of surface and thin film analysis, North-Holland, New York 1986. 2. Tesmer J. R., Nastasi M.: Handbook of modern ion beam materials analysis, Materials research society, Pittsburgh 1995. 3. Frank L., Král J.: Metody analýzy povrchů; iontové, sondové a speciální metody, Academia, Praha 2002. 4. A. Mackova, A. Pratt, Handbook of Spectroscopy: Second, Enlarged Edition,2-4 (2014)741-778, Ion/Neutral Probe Techniques (Book Chapter) 5. C. Jeynes, M.J. Bailey, N.J. Bright, M.E. Christopher, G.W. Grime, B.N. Jones, V.V. Palitsin, R.P. Webb, ‘‘Total IBA’’ – Where are we?, Nuclear Instruments and Methods in Physics Research B 271 (2012) 107–118, 6. A. Zucchiatti, A. Redondo-Cubero, Ion beam analysis: New trends and challenges, Nuclear Instruments and Methods in Physics Research B 331 (2014) 48–54 7. C. Jeynes, N. P. Barradas, and E. Szilágyi, Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry, Anal. Chem., 2012, 84 (14), pp 6061–6069 8. Kim Man Yu, Ion Beam Analysis in Materials Science, Lawrence Berkeley National Laboratory https://drive.google.com/file/d/0B2JUoXR-XKz6OWNhZWRjNGYtNTFmNC00YzFiLTkzYjItNjMzOGI2MTlhNmVk/view |
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Last update: doc. Mgr. Milan Krtička, Ph.D. (10.06.2019)
Požadavky ke zkoušce odpovídají sylabu předmětu v rozsahu prezentovaném na přednášce. |
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Last update: doc. RNDr. Anna Macková, Ph.D. (16.01.2019)
The lecture is focused on the physical description of the main processes taking place in the interaction of charged and neutral particles with the solid, where there are a series of elastic and inelastic processes involving the incident particles and the atoms of the target material. In addition, a neutron nuclear analytical method for elemental analysis, it means neutron activation analysis (NAA) and neutron depth profiling (NDP), will be part of lectures based on nuclear reactions with light nuclei of the studied material. Part of the lecture is a basic description of these phenomena, their physical principles and the use of these processes for qualitative and quantitative elemental analysis of materials. In the frame of the lecture main physical principles and applications of ion analytical methods will be described, which are used for the study of surface properties and solids interface. Ion beam analytical techniques and neutron beam techniques will be directly discussed in connection to significant applications in material science and technology. Ion elastic processes with target nuclei (RBS - Rutherford back scattering, ERDA - RBS-channeling) will be presented as well as inelastic processes with electrons of target atoms or nuclear reactions (PIXE - proton-induced retgenic fluorescence, NRA - analysis by nuclear reactions). At the end of the lecture is presented an overview of methods, their use and comparison of analytical possibilities they provide (sensitivity, depth and area resolution, lowest detectable concentration etc.)
Blocks-weeks in semester
1. Elastic and inelastic processes occurring after impact of charged particles on solids 2. Sources of charged particles for nuclear analysis 3. Basic principles of ion spectroscopy, X-ray. and gamma spectroscopy 4. Fundamentals of ion beam analytical methods - RBS, ERDA, quantitative and qualitative analysis 5. Fundamentals of Nuclear Analytical Ion Methods - PIXE PIGE, NRA, Quantitative and Qualitative Analysis 6. Method of ion channeling in crystalline materials 7. Ion microprobe and elemental lateral mapping 8. Application of ion beam analytical methods on different types of materials - sensitivity, element profiling, detection limits 9. Elastic and inelastic processes occurring after the neutrons impact on the solid 10. Neutron sources - nuclear reactors and instrumentation of neutron diffraction and NAA 11. Basic principles of neutron spectroscopy 12. NDP, NAA - nuclear methods and their qualitative and quantitative possibilities 13. Practical exercises at the Tandetron Laboratory, ÚJF AV ČR, v. I. Practical demonstration of knowledge by performing measurements and elaboration of a protocol / presentation on selected topics from the lecture circle.
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