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Practical application of atomic force microscopy - NFPL500

Title:	Praktické užití mikroskopie atomárních sil (AFM)
Guaranteed by:	Department of Condensed Matter Physics (32-KFKL)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2013
Semester:	summer
E-Credits:	2
Hours per week, examination:	summer s.:0/2, C [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech, English
Teaching methods:	full-time
Teaching methods:	full-time

Guarantor:	RNDr. Klára Uhlířová, Ph.D. prof. Ing. Andrey Shukurov, Ph.D.

Opinion survey results Examination dates SS schedule Noticeboard

Annotation -

Last update: T_KFES (15.05.2013)

Exercises on atomic force microscopy (AFM) and related techniques. Tha basic priciples and functions of AFM. Wide range materials studies, and studies of various physical properites: conductance c-AFM, magnetic force microscopy (MFM, domain structure), adhesion properties etc. Choice of proper methods and probes for given experiment. Suitable for most of Msc students of experimental physics.

Course completion requirements -

Last update: Mgr. Kateřina Mikšová (13.05.2022)

For the course completion, five selected practical exercises have to be attended. One of the exercises will be presented (a good presentation) to the audience of the course's participants (and teachers) at the end of the semester.

Syllabus -

Last update: T_KFES (15.05.2013)

1. Introduction to AFM and construction of the microscopes

2. Kontakt mode AFM, semi-contact (tapping) mode AFM, comparison of the techniques

3. Electric techniques: conducting AFM, electric force microscopu (EFM), Klelvinprobe force microscopu (KPFM)

4. Studies of magnetic domain structure in premalloys

5. Cell observation

6. Growth of nanostructure polymer films

7. Roughness and structure of crystals grains