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Practical Applications of Scanning Electron Microscopy - NFPL307

Title:	Praktické užití skenovací elektronové mikroskopie
Guaranteed by:	Department of Physics of Materials (32-KFM)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2014
Semester:	both
E-Credits:	4
Hours per week, examination:	0/3, C [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Teaching methods:	full-time
Teaching methods:	full-time
Note:	you can enroll for the course repeatedly you can enroll for the course in winter and in summer semester

Guarantor:	RNDr. Petr Harcuba, Ph.D. RNDr. Jitka Stráská, Ph.D.

Opinion survey results Examination dates WS schedule SS schedule Noticeboard

Annotation -

Last update: doc. RNDr. Josef Pešička, CSc. (29.04.2016)

Sample preparation for electron microscopy . Basic principles and controlling of scanning electron microscope. Imaging using secondary and back-scattered electrons. Chemical analysis by means of EDX and WDX. Analysis of crystallographic orientation and texture by means of EBSD.

Course completion requirements - Czech

Last update: RNDr. Jitka Stráská, Ph.D. (14.06.2019)

Zápočet je udělován na základě aktivní účasti na cvičení (výuce na skenovacím elektronovém mikroskopu na Katedře fyziky materiálů).

Literature - Czech

Last update: doc. RNDr. Josef Pešička, CSc. (23.04.2014)

Joseph Goldstein: Scanning Electron Microscopy and X-ray Microanalysis, Springer, 2003.

Syllabus -

Last update: doc. RNDr. Josef Pešička, CSc. (29.04.2016)

Sample preparation for electron microscopy .

Basic principles and controlling of scanning electron microscope.

Imaging using secondary and back-scattered electrons.

Chemical analysis by means of EDX and WDX.

Analysis of crystallographic orientation and texture by means of EBSD.