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Course, academic year 2023/2024
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Physical Methods in Nanostructure Studies - NFPL199
Title: Fyzikální metody studia nanostruktur
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2017
Semester: summer
E-Credits: 3
Hours per week, examination: summer s.:2/0, Ex [HT]
Capacity: unlimited
Min. number of students: unlimited
4EU+: no
Virtual mobility / capacity: no
State of the course: taught
Language: Czech
Teaching methods: full-time
Teaching methods: full-time
Guarantor: prof. RNDr. Miloš Janeček, CSc.
prof. RNDr. Václav Holý, CSc.
Annotation -
Last update: JANECEK (18.05.2007)
The lecture gives an overview of experimental methods suitable for the investigation of various types of nanostructures (semiconductor and metallic nanostructures, surfaces and thin layers, metallic and dielectric nanoparticles) with the emphasis to the study of morphology, electron and phonon properties. In addition to the description of the methods, the lecture will formulate physical principles of the methods and a survey of recent experimental results. The content of the lecture will be modified accord-ing to subjects of the PhD theses of the participants.
Course completion requirements - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Zkouška se sestává z písemné a ústní části. Písemná část spočívá ve vyřešení velmi snadného problému, který nevyžaduje dlouhé počítání (max. 30 min). Ústní část navazuje na řešení zmíněného problému a trvá max. 45 min. Známka zkoušky se stanoví ze souhrnného hodnocení písemné a ústní části. Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Literature -
Last update: JANECEK (18.05.2007)

R.-J.Ror: Methods of x-ray and Neutron Scattering in Polymer Science

B.J. Gabrys (Ed.) Applications of Neutron Scattering to Soft Condensed Matter, Gordon and Breach Science Publisher, 2000

U. Pietsch et al., High-resolution x-ray scattering from thin films and nanostructures, Springer 2004

David B.Williams and C.Barry Carter, Transmission Electron Microscopy, A Text-book for Material Science 1996 Plenum Press, New York

J. Stangl, V. Holý and G. Bauer, Structural properties of self-organized semiconductor nanostructures, Rev. Mod. Phys. 76, 725-783 (2004).

N. N. Ledencov, D. Bimberg, M. Grundmann, Quantum Dot Heterostructures, 1999 J. Wiley.

Requirements to the exam - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Syllabus -
Last update: JANECEK (18.05.2007)

1. Methods of imaging of low-dimensional structures

Transmission electron microscopy, low-energy electron microscopy, scanning techniques: scanning electron microscopy, scanning tunneling microscopy, atomic force microscopy and its modifications

2. Diffraction methods for the study of low-dimensional structures

Diffracrion of high-energy electrons, diffraction of low-energy electrons, x-ray diffraction, x-ray reflection, small-angle x-ray scattering

3. Study of electron states in nanostructures

Optical spectroscopy, ellipsometry, photoelectron spectroscopy

4. Study of phonon states in nanostructures

Inelastic neutron scattering, Raman scattering, ellipsometry and IR absorption

5. Chemical analysis of nanostructures

Methods using characteristic x-ray radiation (x-ray fluorescence, electron en-ergy-dispersive analysis, anomalous x-ray scattering)

Electron spectroscopy (Auger spectroscopy, EELS method)

Ion spectroscopy (Rutherford backscattering, SIMS method)

 
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