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X-ray Study of Real Structure of Thin Films - NFPL149

Title:	Rentgenografické studium reálné struktury tenkých vrstev
Guaranteed by:	Department of Condensed Matter Physics (32-KFKL)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2005 to 2016
Semester:	summer
E-Credits:	3
Hours per week, examination:	summer s.:2/0, Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Teaching methods:	full-time
Teaching methods:	full-time
Additional information:	http://htp://krystal.karlov.mff.cuni.cz/FPL149

Guarantor:	prof. RNDr. Radomír Kužel, CSc. prof. RNDr. Václav Holý, CSc.

Opinion survey results Examination dates Schedule Noticeboard

Annotation -

Last update: T_KFES (23.05.2003)

Application of kinematic and dynamic diffraction theory to study of the structure and morphology of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures. High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study of real structure of thin films.

Syllabus -

Last update: prof. RNDr. Václav Holý, CSc. (29.04.2019)

Application of kinematic and dynamic diffraction theory to study of the structure and morphology

of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures.

High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their

applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study

of real structure of thin films.