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Structure of Materials - NFPL133

Title:	Struktura materiálů
Guaranteed by:	Department of Physics of Materials (32-KFM)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2012
Semester:	winter
E-Credits:	4
Hours per week, examination:	winter s.:3/0, Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Teaching methods:	full-time
Teaching methods:	full-time
Additional information:	http://krystal.karlov.mff.cuni.cz/fpl133

Guarantor:	prof. RNDr. Radomír Kužel, CSc. prof. RNDr. Miloš Janeček, CSc. prof. RNDr. Kristián Mathis, Ph.D., DrSc.

Annotation -

Last update: T_KFK (09.04.2003)

Bonds in materials. Crystal lattice, lattice defects. The influence of lattice defects on materials properties. Experimental methods.

Course completion requirements -

Last update: prof. RNDr. Miloš Janeček, CSc. (08.06.2019)

The subject is terminated by the oral exam. The requirements for the exam correspond to the syllabus/handout which was presented at the lectures.

Literature - Czech

Last update: doc. RNDr. Josef Pešička, CSc. (17.04.2014)

P. Kratochvíl, P.Lukáč, B. Sprušil: Úvod do fyziky kovů I, SNTL/Alfa 1984.

V. Valvoda, M. Polcarová, P. Lukáč: Základy strukturní analýzy, Karolinum, Praha 1992.

D.B. Williams, C.B. Carter, Transmission Electron Microscopy - a textbook of materiál science, Springer, 2009.

G.E. Bacon: Neutron diffraction, Clarendon Press, Oxford, 1975.

F.R.N. Nabarro: Theory of Crystal Dislocations, Clarendon Press, Oxford, 1967.

I. Kraus : Úvod do strukturní rentgenografie, Academia, 1985.

Syllabus -

Last update: prof. RNDr. Radomír Kužel, CSc. (04.10.2012)

Principles of transmission electron microscopy

Kinematic theory of electron diffraction

Kinematic and dynamic theory of X-ray diffraction

Defect contrast in the crystal lattice

Scanning electron microscopy, topografic and compositional contrast

EBSD (electron back-scattered diffraction)

Neutron diffraction

Grain boundaries - structural models, basic characteristics and properties

Study of real structure by X-ray diffraction

Residual stresses and textures

XRD line profile analysis