Subjects

Your browser does not support JavaScript, or its support is disabled. Some features may not be available.

Applied Structure Analysis - NFPL040

Title:	Aplikovaná strukturní analýza
Guaranteed by:	Department of Condensed Matter Physics (32-KFKL)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2015
Semester:	summer
E-Credits:	3
Hours per week, examination:	summer s.:1/1, C+Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Teaching methods:	full-time
Teaching methods:	full-time
Additional information:	http://krystal.karlov.mff.cuni.cz/FPL040

Guarantor:	doc. RNDr. Stanislav Daniš, Ph.D.
Classification:	Physics > Solid State Physics

Opinion survey results Examination dates Schedule Noticeboard

Annotation -

Last update: T_KFES (23.05.2001)

This lecture is intended to diploma and PhD students specialised in the X-ray diffraction. The lecture is an extension of lectures FPL012 (Structure of matter and diffraction of radiation) and FPL030 (Diffraction methods). It covers the following topics: (a) treatment of instrumental phenomena in X-ray diffraction, (b) study of temperature atomic vibrations, (c) study of chemical inhomogeneities and diffusion processes, (d) diffraction on thin films, (e) diffraction on low -dimensionally periodic structures (multilayers, quantum dots) and (e) some computational methods in structure analysis. The complete course on advanced methods in X-ray diffraction consists of two lectures: FPL029 (X-ray diffraction study of the real structure of matter) and FPL040.

Syllabus -

Last update: T_KFES (26.05.2003)

1. Accuracy in diffraction experiment - instrumental aberrations, microstructural parameters, geometrical factors, sample transparency, absorption of x-rays, surface roughness, primary and secondary extinction, preferred orientation of crystallites

2. Dynamical effects in crystals.Thermal vibrations, diffusion, chemical inhomogeneity

3. Short and long range ordering - diffractional study of local arrangement at phase transition, x-ray diffraction on structures with large periodicity (multilayers, superconductors) high and low angle diffraction, reflectivity (optical theory, DBWA)

4. Experimental methods of determining the short range orderining - EXAFS, diffuse scattering

5. Computional methods in applied structural analysis - simulating of diffraction pattern (Lazy Pulverix), refinement of real crystal structure (the Rietveld method), deconvolution. Determinination of thin film, multilayer and superconductor structure parameters (SUPREX)