Electron and Ion Optics - NEVF124
|
|
|
||
Last update: T_KEVF (15.05.2005)
|
|
||
Last update: T_KEVF (15.05.2005)
Urgošík B.: Elektronová a iontová optika, SPN, Praha 1982. Lenc M., Lencová B.: Optické prvky elektronových mikroskopů, in Metody analýzy povrchů II., ed. Eckertová L., Frank L., Academia, Praha 1996. Lencová B., Lenc M.: Optika iontových svazků, in Metody analýzy povrchů III., ed. Frank L., Král J., Academia, Praha 2002. |
|
||
Last update: RNDr. Tomáš Gronych, CSc. (12.10.2017)
Zkouška je ústní. Požadavky ke zkoušce odpovídají sylabu předmětu v rozsahu, který byl prezentován na přednáškách. |
|
||
Last update: T_KEVF (15.05.2005)
Equations of motion. Energy, velocity and momentum of charged particle in stationary fields. Non-relativistic equations of motion. Motion in homogenous electric and magnetic fields. Classical optics analogy and its limitation. 2. Determination of fields and trajectories Analogue methods to solve the Laplace equation. Numerical solutions to the Laplace equation. 3. Axially symmetrical fields Axially symmetrical electric field. Axially symmetrical magnetic field. Paraxial trajectory equation. 4. Electrostatic lenses Classification. Construction of projection. Types of lenses and its properties. Electron optics reflectors. Aberrations. 5. Magnetic lenses Main types of magnetic lenses. Aberrations. Optics of lenses with a bell-shaped field. 6. Properties of special fields One-plane symmetry field. Cylindrical lenses. Two-plane symmetry field. Quadrupole lenses. Sector fields. 7. Space charge Influence of space charge to charged particle beam. Formation of intensive beams. 8. Applications Main applications of electron and ion optics systems. |