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Scattering and microscopy methods - MC260P127

Title:	Rozptylové a mikroskopické metody
Czech title:	Rozptylové a mikroskopické metody
Guaranteed by:	Department of Physical and Macromolecular Chemistry (31-260)
Faculty:	Faculty of Science
Actual:	from 2022
Semester:	summer
E-Credits:	3
Examination process:	summer s.:
Hours per week, examination:	summer s.:1/1, Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Note:	enabled for web enrollment

Guarantor:	prof. RNDr. Miroslav Štěpánek, Ph.D.
Teacher(s):	prof. RNDr. Pavel Matějíček, Ph.D. Michal Mazur, Ph.D. prof. RNDr. Miroslav Štěpánek, Ph.D.
Incompatibility :	MC260S27Z, MC260S28L

Opinion survey results Examination dates SS schedule

Annotation -

Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (08.02.2022)

Introduction to microscopic and scattering methods. The course combines lectures comprising both theoretical principles of the methods and their instrumentation with practical courses.

Literature - Czech

Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (05.03.2019)

Egerton, R.F. Physical Principles of Electron Microscopy, Springer Verlag 2007

Meyer, E., Hug, H.J., Bennewitz, R. Scanning Probe Microscopy, Spinger Verlag 2004

Zemb, T., Lindner, P. (Eds.) Neutrons, X-rays and Light. Scattering Methods Applied to Soft Condensed Matter, North Holland 2002

Requirements to the exam -

Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (04.02.2022)

Oral exam

Syllabus -

Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (04.02.2022)

1. Electron microscopy

Basic principles of electron microscopy imaging, magnification, point resolution, contrast, chromatic and spherical aberration. Transmission and scanning electron microscopy, detection in SEM/STEM methods, interaction of electrons with the sample, EDS and EELS techniques. Sample preparation, cryogenic transmission electron microscopy

2. Scanning probe microscopy

Basic principles of SPM imaging, atomic force microscopy in contact, semicontact and noncontact mode, scanning tunelling microscopy

3. Scattering methods

Introduction to scattering theory, scattering vector, scattering length and scattering cross-section, form factor and structure factor. Analysis of scattering curves. Dynamic light scattering, intensity autocorrelation function, translational and rotational diffusion coefficient from DLS. Ligh, X-ray and neutron scattering measurements - radiation sources, detection and calibration.