Methods of Measuring Electric Properties of Semiconducting and Insulating Materials - NBCM211
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Last update: T_KMF (23.05.2006)
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Last update: T_KMF (23.05.2006)
F. Kremer, A. Schönhals (eds.): Broadband Dielectric Spectroscopy, Springer 2003, kapitola 2 (případně 3, 12 a 13) J.P. Rundt, J.J. Fitzgerald (eds.): Dielectric Spectroscopy of Polymeric Materials, American Chemical Society 1997, kapitola 2 D.K. Schroder: Semiconductor Material and Device Characterization, John Wiley & Sons, Inc. 1998, kapitoly 1.2, 2.2, 2.5 Keithley: Low Level Measurements Handbook, 5th edition, Keithely Instruments, Inc. 1998 M. Honda: The Impedance Measurement Handbook, Yokogawa-Hewlett-Packard LTD. 1989 |
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Last update: T_KMF (23.05.2006)
Basic methods of electrical conductivity measurement, the influence of contacts, features of devices (electrometer, picoammeter, nanovoltmeter) Other transport properties measurement Measurements of Hall constant, thermoelectric power and thermal conductivity. Charge carriers concentration study. AC methods of measurement Basics of impedance measurement, influence of parasitic values - real, effective and indicated value, survey of methods of measurement, autobalance bridge principle, ways of connecting the sample, parasitic values elimination, calibration and compensation, examples of the measurements and devices Measurement of time dependencies in dielectrics Isothermal measurements of current-time dependencies and their evaluation. Thermostimulated measurement methods. |