Radioanalytical Methods - NJSF024
Title in English: Jaderné analytické metody
Guaranteed by: Institute of Particle and Nuclear Physics (32-UCJF)
Faculty: Faculty of Mathematics and Physics
Actual: from 2018
Semester: winter
E-Credits: 3
Hours per week, examination: winter s.:2/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Guarantor: doc. RNDr. Anna Macková, Ph.D.
Classification: Physics > Nuclear and Subnuclear Physics
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Annotation -
Last update: T_UCJF (21.05.2001)
The lectures give an introductory overview of the processes and methods of nuclear and atomic physics used for the analysis of composition and structure of materials in an interdisciplinary research.
Course completion requirements - Czech
Last update: doc. Mgr. Milan Krtička, Ph.D. (10.06.2019)

Složení ústní zkoušky.

Literature -
Last update: doc. RNDr. Anna Macková, Ph.D. (21.01.2019)

1. Tirira J., Serruys Y., Trocellier P.: Forward recoil spectrometry, Plenum Press, New York 1996.

Feldman L.C., Mayer J.W.: Fundamentals of surface and thin film analysis, North-Holland, New York 1986.

2. Tesmer J. R., Nastasi M.: Handbook of modern ion beam materials analysis, Materials research society, Pittsburgh 1995.

3. Frank L., Král J.: Metody analýzy povrchů; iontové, sondové a speciální metody, Academia, Praha 2002.

4. A. Mackova, A. Pratt, Handbook of Spectroscopy: Second, Enlarged Edition,2-4 (2014)741-778, Ion/Neutral Probe Techniques

(Book Chapter)

5. C. Jeynes, M.J. Bailey, N.J. Bright, M.E. Christopher, G.W. Grime, B.N. Jones, V.V. Palitsin, R.P. Webb, ‘‘Total IBA’’ – Where are we?, Nuclear Instruments and Methods in Physics Research B 271 (2012) 107–118,

6. A. Zucchiatti, A. Redondo-Cubero, Ion beam analysis: New trends and challenges, Nuclear Instruments and Methods in Physics Research B 331 (2014) 48–54

7. C. Jeynes, N. P. Barradas, and E. Szilágyi, Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry, Anal. Chem., 2012, 84 (14), pp 6061–6069

8. Kim Man Yu, Ion Beam Analysis in Materials Science, Lawrence Berkeley National Laboratory

Requirements to the exam - Czech
Last update: doc. Mgr. Milan Krtička, Ph.D. (10.06.2019)

Požadavky ke zkoušce odpovídají sylabu předmětu v rozsahu prezentovaném na přednášce.

Syllabus -
Last update: doc. RNDr. Anna Macková, Ph.D. (16.01.2019)

The lecture is focused on the physical description of the main processes taking place in the interaction of charged and neutral particles with the solid, where there are a series of elastic and inelastic processes involving the incident particles and the atoms of the target material.

In addition, a neutron nuclear analytical method for elemental analysis, it means neutron activation analysis (NAA) and neutron depth profiling (NDP), will be part of lectures based on nuclear reactions with light nuclei of the studied material. Part of the lecture is a basic description of these phenomena, their physical principles and the use of these processes for qualitative and quantitative elemental analysis of materials. In the frame of the lecture main physical principles and applications of ion analytical methods will be described, which are used for the study of surface properties and solids interface. Ion beam analytical techniques and neutron beam techniques will be directly discussed in connection to significant applications in material science and technology. Ion elastic processes with target nuclei (RBS - Rutherford back scattering, ERDA - RBS-channeling) will be presented as well as inelastic processes with electrons of target atoms or nuclear reactions (PIXE - proton-induced retgenic fluorescence, NRA - analysis by nuclear reactions). At the end of the lecture is presented an overview of methods, their use and comparison of analytical possibilities they provide (sensitivity, depth and area resolution, lowest detectable concentration etc.)

Blocks-weeks in semester

1. Elastic and inelastic processes occurring after impact of charged particles on solids

2. Sources of charged particles for nuclear analysis

3. Basic principles of ion spectroscopy, X-ray. and gamma spectroscopy

4. Fundamentals of ion beam analytical methods - RBS, ERDA, quantitative and qualitative analysis

5. Fundamentals of Nuclear Analytical Ion Methods - PIXE PIGE, NRA, Quantitative and Qualitative Analysis

6. Method of ion channeling in crystalline materials

7. Ion microprobe and elemental lateral mapping

8. Application of ion beam analytical methods on different types of materials - sensitivity, element profiling, detection limits

9. Elastic and inelastic processes occurring after the neutrons impact on the solid

10. Neutron sources - nuclear reactors and instrumentation of neutron diffraction and NAA

11. Basic principles of neutron spectroscopy

12. NDP, NAA - nuclear methods and their qualitative and quantitative possibilities

13. Practical exercises at the Tandetron Laboratory, ÚJF AV ČR, v. I.

Practical demonstration of knowledge by performing measurements and elaboration of a protocol / presentation on selected topics from the lecture circle.