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Course, academic year 2018/2019
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Practical application of atomic force microscopy - NFPL500
Title in English: Praktické užití mikroskopie atomárních sil (AFM)
Guaranteed by: Department of Condensed Matter Physics (32-KFKL)
Faculty: Faculty of Mathematics and Physics
Actual: from 2013
Semester: summer
E-Credits: 2
Hours per week, examination: summer s.:0/2 C [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Guarantor: RNDr. Klára Uhlířová, Ph.D.
doc. Ing. Andrey Shukurov, Ph.D.
Annotation -
Last update: T_KFES (15.05.2013)
Exercises on atomic force microscopy (AFM) and related techniques. Tha basic priciples and functions of AFM. Wide range materials studies, and studies of various physical properites: conductance c-AFM, magnetic force microscopy (MFM, domain structure), adhesion properties etc. Choice of proper methods and probes for given experiment. Suitable for most of Msc students of experimental physics.
Syllabus -
Last update: T_KFES (15.05.2013)

1. Introduction to AFM and construction of the microscopes

2. Kontakt mode AFM, semi-contact (tapping) mode AFM, comparison of the techniques

3. Electric techniques: conducting AFM, electric force microscopu (EFM), Klelvinprobe force microscopu (KPFM)

4. Studies of magnetic domain structure in premalloys

5. Cell observation

6. Growth of nanostructure polymer films

7. Roughness and structure of crystals grains

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