Practical Applications of Scanning Electron Microscopy - NFPL307
|
|
|
||
Sample preparation for electron microscopy .
Basic principles and controlling of scanning electron microscope.
Imaging using secondary and back-scattered electrons.
Chemical analysis by means of EDX and WDX.
Analysis of crystallographic orientation and texture by means of EBSD.
Last update: Pešička Josef, doc. RNDr., CSc. (29.04.2016)
|
|
||
Zápočet je udělován na základě aktivní účasti na cvičení (výuce na skenovacím elektronovém mikroskopu na Katedře fyziky materiálů). Last update: Stráská Jitka, RNDr., Ph.D. (14.06.2019)
|
|
||
Joseph Goldstein: Scanning Electron Microscopy and X-ray Microanalysis, Springer, 2003. Last update: Pešička Josef, doc. RNDr., CSc. (23.04.2014)
|
|
||
Sample preparation for electron microscopy . Basic principles and controlling of scanning electron microscope. Imaging using secondary and back-scattered electrons. Chemical analysis by means of EDX and WDX. Analysis of crystallographic orientation and texture by means of EBSD. Last update: Pešička Josef, doc. RNDr., CSc. (29.04.2016)
|