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Course, academic year 2024/2025
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Practical Applications of Scanning Electron Microscopy - NFPL307
Title: Praktické užití skenovací elektronové mikroskopie
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2014
Semester: both
E-Credits: 4
Hours per week, examination: 0/3, C [HT]
Capacity: unlimited
Min. number of students: unlimited
4EU+: no
Virtual mobility / capacity: no
State of the course: taught
Language: Czech
Teaching methods: full-time
Note: you can enroll for the course repeatedly
you can enroll for the course in winter and in summer semester
Guarantor: RNDr. Petr Harcuba, Ph.D.
RNDr. Jitka Stráská, Ph.D.
Teacher(s): RNDr. Petr Harcuba, Ph.D.
doc. RNDr. Peter Minárik, Ph.D.
RNDr. Jitka Stráská, Ph.D.
Annotation -
Sample preparation for electron microscopy . Basic principles and controlling of scanning electron microscope. Imaging using secondary and back-scattered electrons. Chemical analysis by means of EDX and WDX. Analysis of crystallographic orientation and texture by means of EBSD.
Last update: Pešička Josef, doc. RNDr., CSc. (29.04.2016)
Course completion requirements - Czech

Zápočet je udělován na základě aktivní účasti na cvičení (výuce na skenovacím elektronovém mikroskopu na Katedře fyziky materiálů).

Last update: Stráská Jitka, RNDr., Ph.D. (14.06.2019)
Literature - Czech

Joseph Goldstein: Scanning Electron Microscopy and X-ray Microanalysis, Springer, 2003.

Last update: Pešička Josef, doc. RNDr., CSc. (23.04.2014)
Syllabus -

Sample preparation for electron microscopy .

Basic principles and controlling of scanning electron microscope.

Imaging using secondary and back-scattered electrons.

Chemical analysis by means of EDX and WDX.

Analysis of crystallographic orientation and texture by means of EBSD.

Last update: Pešička Josef, doc. RNDr., CSc. (29.04.2016)
 
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