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Experimental exercises for X-ray scattering methods - NFPL253

Title:	Exprimentální cvičení k RTG rozptylovým metodám
Guaranteed by:	Department of Condensed Matter Physics (32-KFKL)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2024
Semester:	both
E-Credits:	3
Hours per week, examination:	0/2, C [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech, English
Teaching methods:	full-time
Note:	you can enroll for the course in winter and in summer semester

Guarantor:	Mgr. Lukáš Horák, Ph.D.
Teacher(s):	Mgr. Lukáš Horák, Ph.D.

Opinion survey results Examination dates WS schedule Noticeboard

Annotation -

Practical exercises involve preparing, carrying out, and interpreting basic x-ray scattering experiments (X-ray reflectivity, low-res wide / hi-res reciprocal-space mapping, powder diffraction).

Last update: Mikšová Kateřina, Mgr. (15.05.2024)

Course completion requirements -

Mastery of a course is confirmed by a course credit. The condition for obtaining a credit is the measurement of all announced experimental tasks.

Last update: Mikšová Kateřina, Mgr. (15.05.2024)

Literature -

V. Valvoda, M. Polcarová, P. Lukáč : Základy strukturní analýzy. Karolinum. Praha 1992

V. Holý, U. Pietsch, T. Baumbach : High-Resolution X-ray Scattering from Thin Films and Multilayers. Springer Verlag. Berlin Heidelberg 1999

J. Als-Nielsen, D. McMorrow: Elements of Modern X‐ray Physics, John Wiley & Sons, Ltd, 2011

Last update: Mikšová Kateřina, Mgr. (15.05.2024)

Syllabus -

Experiments to be performed:

Measurement of thickness and density of thin films (reflectometry)

Determination of density profile of bilayer/multilayer (reflectometry)

Measurement of thickness of crystalline thin film (high-resolution diffraction)

Measurement of lattice parameters of thin film (high-resolution diffraction)

Phase analysis of unknown powder sample and refinement of lattice parameters (powder diffraction)

Phase analysis and refinement of lattice parameters of thin polycrystalline layer (parallel beam diffraction)

Qualitative determination of texture of thin film on substrate (wide reciprocal space mapping method)

Measurement of texture of polycrystalline sample (in parallel beam)

Measurement of residual stress in thin film (in parallel beam)

Each experimental task includes

Sample preparation for the given experiment

Familiarization with measurement software for instrument control

Selection and configuration of optics of the instrument including basic calibration

Sample alignment in the instrument

Definition of measurement parameters, collection of experimental data

Interpretation of data using available software

Last update: Mikšová Kateřina, Mgr. (15.05.2024)