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X-ray Study of Real Structure of Thin Films - NFPL149

Title:	Rentgenografické studium reálné struktury tenkých vrstev
Guaranteed by:	Department of Condensed Matter Physics (32-KFKL)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2020
Semester:	summer
E-Credits:	3
Hours per week, examination:	summer s.:2/0, Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	English
Teaching methods:	full-time
Additional information:	http://htp://krystal.karlov.mff.cuni.cz/FPL149

Guarantor:	prof. RNDr. Radomír Kužel, CSc. prof. RNDr. Václav Holý, CSc. RNDr. Milan Dopita, Ph.D.
Teacher(s):	prof. RNDr. Václav Holý, CSc. prof. RNDr. Radomír Kužel, CSc.

Opinion survey results Examination dates Noticeboard

Annotation -

Application of kinematic and dynamic diffraction theory to study of the structure and morphology of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures. High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study of real structure of thin films.

Last update: T_KFES (23.05.2003)

Course completion requirements -

Oral and written part. Written part consists in solution of simple problem without long calculations (max. 30 min). Oral part follows the problem (max. 45 min).

Last update: Kužel Radomír, prof. RNDr., CSc. (12.05.2023)

Literature -

Jens Als-Nielsen, Des McMorrow: Elements of Modern X-Ray Physics, Wiley 2011

Ullrich Pietsch, Vaclav Holy, Tilo Baumbach: High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures, Springer 2004

Last update: Holý Václav, prof. RNDr., CSc. (29.04.2019)

Requirements to the exam - Czech

Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Last update: Holý Václav, prof. RNDr., CSc. (29.04.2019)

Syllabus -

Application of kinematic and dynamic diffraction theory to study of the structure and morphology

of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures.

High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their

applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study

of real structure of thin films.

Last update: Holý Václav, prof. RNDr., CSc. (29.04.2019)