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Course, academic year 2019/2020
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Experimental Methods of Condensed Systems Physics I - NFPL145
Title in English: Experimentální metody fyziky kondenzovaných soustav I
Guaranteed by: Department of Condensed Matter Physics (32-KFKL)
Faculty: Faculty of Mathematics and Physics
Actual: from 2014 to 2019
Semester: winter
E-Credits: 9
Hours per week, examination: winter s.:3/3 C+Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Additional information: http://www.xray.cz/FPL145
Note: enabled for web enrollment
Guarantor: prof. RNDr. Radomír Kužel, CSc.
prof. RNDr. Helena Štěpánková, CSc.
prof. RNDr. Miloš Janeček, CSc.
Class: Fyzika
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFES (14.05.2014)
Experimental methods of element and phase analysis, atomic and electronic structure of the matter. Diffraction, spectroscopy, microscopy, particle scattering. Surface microscopies. Nuclear methods. Principles, characteristics, possibilities and limitations of the methods. In practical part - typical experiments to individual groups of methods.
Aim of the course -
Last update: T_KFNT (11.04.2008)

Methodical and exhibitional excercises to experimental lectures.

Course completion requirements - Czech
Last update: prof. RNDr. Helena Štěpánková, CSc. (14.06.2019)

Předmět je zakončen ústní zkouškou. Podmínkou pro připuštění ke zkoušce je zápočet. K zápočtu je nutná účast na praktické části výuky a vypracování požadovaných referátů ze zadaných úloh. Referát se odevzdává jeden za skupinu (ve skupině 1-3 studenti).

Literature -
Last update: prof. RNDr. Helena Štěpánková, CSc. (14.06.2019)

Václav Valvoda, Milena Polcarová, Pavel Lukáč: Základy strukturní analýzy. Univerzita Karlova. Praha 1992.

Ivo Kraus: Úvod do strukturní rentgenografie. Academia. Praha 1985.

Experimentální techniky v rentgenové a neutronové strukturní analýze. Krystalografická společnost. Praha 1994. ed. R. Kužel.

Miroslav Karlík, Úvod do transmisní elektonové mikroskopie, České vysoké učení technické, 2011, ISBN: 978-80-01-04729-3

B. Voigtlaender: Atomic Force Microscopy and Scanning Tunneling Microscopy, Springer-Verlag Berlin Heidelberg, 2015

D .B. Williams , C.B. Carter: Transmission electron microscopy - A textbook for materials science, Plenum Press, NY, 1996

L. Reimer: Scanning electron microscopy – Physics of image formation and microanalysis, Springer, Berlin Heidelberg, 1985

J. Goldstein, et. al: Scanning electron microscopy and X-ray microanalysis, Springer, Berlin Heidelberg, 2007

V. Hulínský, K. Jurek: Zkoumání látek elektronovým paprskem, V. Hulínsky, SNTL, Praha 1982

Metody analýzy povrchů - Elektronové spektroskopie , editor L. Eckertová, Academia, 1990

Metody analýzy povrchů - Iontové, sondové aspeciální metody , editoři L. Frank, J. Král, Academia, 2002

Practical Surface Analysis, by Auger and Photoelectron Spectroscopy, ed. D. Briggs and M.P.Seah, Wiley, 1983

Practical Surface Analysis, second edition, Volume 2, Ion and Neutral Spectroscopy, ed. D. Briggs and M.P.Seah, Wiley, 1992

John F. Moulder, Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data, Physical Electronics Division, Perkin-Elmer Corporation, 1992

G. Beamson and D. Briggs, High resolution XPS of organic polymers : the Scienta ESCA300 database,Wiley, 1992

C. P. Slichter, Principles of magnetic resonance, Springer 1990

Bernhard Blumich, Essential NMR, Springer 2005

Requirements to the exam - Czech
Last update: prof. RNDr. Radomír Kužel, CSc. (06.10.2017)

Zkouška je ústní se zadáním dvou otázek z probírané tématiky a možností přípravy na místě. Dále pak jsou možné doplňující krátké otázky. Zkouší zpravidla více vyučujících.

Ke zkoušce je vyžadován zápočet.

Syllabus -
Last update: prof. RNDr. Radomír Kužel, CSc. (23.05.2006)
Crystal growth
Methods of crystal growth, metal crystals, compound and alloy, congruent and non-congruent phase, advantages and limitations of individual methods, choice of method Crystal growth of intermetallic compound by Czochralski method
Diffraction methods
Single crystal X-ray diffraction - crystal structure determination, crystal orientation, estimation of crystal quality Laue method, orientation of single crystal or crystal structure determination Powder diffraction - information in powder pattern, lattice parameters determination, phase analysis, profile analysis for real structure study, textures and stresses Lattice parameter determination or phase analysis
Electron microscopy and diffraction
Transmission electron microscopy - methods of visualization in TEM, electron diffraction and its use for orientation determination, contrast in EM Elemental and phase analysis Scanning microscopy - origin of signal in SEM, interaction of electrons in solids, topographic and compositional contrast
Scanning tunneling microscopy -STM
Physical principles of microscopic methods with scanning probe in near field. Practical task with STM. Preparation of STM experiment for study of metal adsorbate on oriented Si surface.
Raman and Infrared spectroscopy
Electron and ion spectroscopies for studies of surfaces
XPS, AES, UPS, EELS, XPD, ISS, SIMS. Surface investigations by electron and ion spectroscopies - review. Energy analysers. Technical equipment for study of surfaces. Physical principles of methods and examples of applications.
Nuclear methods of study of solids - review.
Hyperfine interactions - origin, effects. Use of nuclear methods fro study of atomic, electronic and magnetic structure, examples of applications. Nuclear magnetic resonance and quadrupole resonance in solids. High resolution nuclear magnetic resonance. Positron annihilation. Moessbauer spectroscopy.
 
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