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Course, academic year 2018/2019
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Structure of Materials - NFPL133
Title in English: Struktura materiálů
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2012
Semester: winter
E-Credits: 4
Hours per week, examination: winter s.:3/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Additional information: http://krystal.karlov.mff.cuni.cz/fpl133
Guarantor: prof. RNDr. Radomír Kužel, CSc.
prof. RNDr. Miloš Janeček, CSc.
doc. RNDr. Kristián Mathis, Ph.D., DrSc.
Annotation -
Last update: T_KFK (09.04.2003)
Bonds in materials. Crystal lattice, lattice defects. The influence of lattice defects on materials properties. Experimental methods.
Course completion requirements - Czech
Last update: doc. RNDr. Kristián Mathis, Ph.D., DrSc. (11.10.2017)

podmínkou zakončení předmětu je složení ústní zkoušky

Literature - Czech
Last update: doc. RNDr. Josef Pešička, CSc. (17.04.2014)

P. Kratochvíl, P.Lukáč, B. Sprušil: Úvod do fyziky kovů I, SNTL/Alfa 1984.

V. Valvoda, M. Polcarová, P. Lukáč: Základy strukturní analýzy, Karolinum, Praha 1992.

D.B. Williams, C.B. Carter, Transmission Electron Microscopy - a textbook of materiál science, Springer, 2009.

G.E. Bacon: Neutron diffraction, Clarendon Press, Oxford, 1975.

F.R.N. Nabarro: Theory of Crystal Dislocations, Clarendon Press, Oxford, 1967.

I. Kraus : Úvod do strukturní rentgenografie, Academia, 1985.

Syllabus -
Last update: prof. RNDr. Radomír Kužel, CSc. (04.10.2012)

Principles of transmission electron microscopy

Kinematic theory of electron diffraction

Kinematic and dynamic theory of X-ray diffraction

Defect contrast in the crystal lattice

Scanning electron microscopy, topografic and compositional contrast

EBSD (electron back-scattered diffraction)

Neutron diffraction

Grain boundaries - structural models, basic characteristics and properties 

Study of real structure by X-ray diffraction

Residual stresses and textures

XRD line profile analysis

 
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