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Technology of preparation of crystals and thin films. Structure and properties of thin films (thickness, roughness,
surface energy, stresses, textures etc.). Study of nanoparticles. Dznamic light scattering, Raman and
infrared spectroscopy. Other selected spectroskopic and nuclear methods. Excursions.
Principles and characteristics of individual methods, their possibilities and restrictions. In practical part typical
tasks for the methods.
Last update: T_KFES (14.05.2014)
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Oral exam. For the examination the credit from practical part is necessary. For the credit, participation at practical parts of the subject is required. From selected tasks, a written report is required (for a group of 1-3 students). Last update: Kužel Radomír, prof. RNDr., CSc. (12.05.2022)
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Anders Lund, Masaru Shiotani, Shigetaka Shimada, Principles and applications of ESR spectroscopy, Springer 2011 V. Kuperman, Magnetic Resonance Imagining, Academic Press, Illinois (2000) Bernhard Blumich, Essential NMR, Springer 2005 J.N. Mundy, S.J. Rothman, M.J. Fluss, L.C. Smedskjaer, Methods of Experimental Physics, Vol. 21 Solid State: Nuclear Methods, Academic Press, Orlando (1983) Hiroyuki Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons, 2007 J. M. Hollas: Modern spectroscopy, J. Wiley, 2004 E.de Hoffmann, V. Stroobant: Mass Spectrometry. Principles and Applications, Wiley-Interscience, 2007 Dynamic Light Scattering: With Applications to Chemistry, Biology, and Physics (Dover Books on Physics)by by Bruce J. Berne Marion Birkholz: Thin Film Analysis by X-Ray Scattering. Wiley 2006. Last update: Štěpánková Helena, prof. RNDr., CSc. (14.06.2019)
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Zkouška je ústní se zadáním tří otázek z probírané tématiky a možností přípravy na místě. Dále pak jsou možné doplňující krátké otázky. Zkouší zpravidla více vyučujících. Ke zkoušce je vyžadován zápočet. Last update: Kužel Radomír, prof. RNDr., CSc. (06.10.2017)
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I. Atomic structure
Surface crystallography, symmetry, reciprocal lattice, relaxation, reconstruction. LEED, Ewald construction, diffraction pattern, kinematic and dynamic theory of intensity determination II. Electronic structure one-particle approach. Tamm and Shockley surface states, complex bend structure, surface electronic states many-particles approach photoelectron spectroscopy photoemission Last update: T_KFES (21.05.2004)
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