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Principles of transmission electron microscopy (TEM). Kinematical and dynamic theory of high energy electron
diffraction, dynamic contrast theory of lattice defects. High resolution transmission electron microscopy. Convergent
beam electron diffraction. Analytical methods in TEM. Stereographic projection. For 1st, 2nd year NMgr. FKSM and
PGDS.
Last update: Pešička Josef, doc. RNDr., CSc. (24.06.2026)
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Úspěšné složení ústní zkoušky. Last update: Cieslar Miroslav, doc. RNDr., CSc. (14.05.2019)
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Bohumil Smola: Transmisní elektronová mikroskopie ve fyzice pevných látek, skriptum SPN, Praha 1983. Miroslav Karlík: Úvod do transmisní elektronové mikroskopie, ČVUT, Praha 2011. David B. Williams, C. Barry Carter: Transmission Electron Microscopy, A Textbook for Materials Science, Springer, 2009. Last update: Šlapáková Michaela, RNDr., Ph.D. (04.06.2026)
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Otázky ústní zkoušky se shodují se zněním sylabu. Last update: Cieslar Miroslav, doc. RNDr., CSc. (14.05.2019)
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1. Construction of a transmission electron microscope. Electron source, lenses, detectors, and vacuum system. 2. Interaction of electrons with matter, elastic and inelastic scattering, coherent and incoherent scattering. Electrons in a magnetic field. 3. TEM samples preparation. 4. Kinematical theory of diffraction. Wave-mechanical formulation of fast electrons in a periodic potential, Born approximation, high-energy electron approximation, extinction distance, Bragg position deviation, the intensity of the diffracted beam, limitations of kinematical approximation, structure and shape factor, and the amplitude diffracted by a distorted crystal. 5. Dynamical theory of diffraction. Wave-optical and wave-mechanical formulation, equivalence of the two formulations of the dynamical theory, symmetry of the Bloch waves, two-beam approximation, phenomenological treatment of normal and anomalous absorption, introduction to the many-beam theory of diffraction, systematic reflections, and multilayers. 6. The matrix formulation of electron diffraction theory and the treatment of the many-beam effects, general matrix formulation of many-beam theory for imperfect crystals, contrast at planar faults, stacking faults, antiphase boundaries, grain and phase boundaries, dislocation contrast, dislocation contrast in real crystals, contrast on particles and precipitates. 7. High-resolution TEM. Phase contrast, transfer function in electron microscopy, Scherzer focus, and simulations of lattice images. 8. Selected area diffraction and microdiffraction, convergent beam electron diffraction, ZOLZ and HOLZ in CBED, determination of specimen thickness and extinction depth from CBED. 9. Analytical electron microscopy, EDS, EELS. Introduction to scanning transmission electron microscopy. 10. Stereographic projection. Basic principles, determination of crystal orientation, determination of subgrain misorientation, and determination of Burgers vector of a dislocation. Last update: Šlapáková Michaela, RNDr., Ph.D. (04.06.2026)
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