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Course, academic year 2018/2019
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Structure of Surfaces and Thin Films - NFPL106
Title in English: Struktura povrchů a tenkých vrstev
Guaranteed by: Department of Condensed Matter Physics (32-KFKL)
Faculty: Faculty of Mathematics and Physics
Actual: from 2017
Semester: winter
E-Credits: 3
Hours per week, examination: winter s.:2/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Guarantor: prof. RNDr. Radomír Kužel, CSc.
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFES (23.05.2001)
Surface crystallography. Methods - LEED, scattering of ions and atoms (ISS, RBS, ...). Microscopic methods (FIM, STM, AFM ...). X-ray structure analysis of polycrystalline and single crystal thin films.
Course completion requirements - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Zkouška se sestává z písemné a ústní části. Písemná část spočívá ve vyřešení velmi snadného problému, který nevyžaduje dlouhé počítání (max. 30 min). Ústní část navazuje na řešení zmíněného problému a trvá max. 45 min. Známka zkoušky se stanoví ze souhrnného hodnocení písemné a ústní části. Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Literature - Czech
Last update: RNDr. Pavel Zakouřil, Ph.D. (05.08.2002)
  • např. Ludmila Eckertová : Physics of Thin Films. Plenum Press New York, London, SNTL Prague 1986
  • Ludmila Eckertová : Metody analýzy povrchů (Experimentální metody fyziky pevných látek, svazek 4), Katedra fyziky kovů, Praha 1982
  • K.N.Tu a kol. : Analytical Techniques for Thin Films New York 1986
  • H.Oeschner : Thin Films and Depth Profile Analysis. Springer Verlag 1984
  • K.H.Rieder : \"Experimental Methods for Determining Surface Structures and Surface Corrugations\" v Topics in Current Physics vol.41 - \"Structure and Dynamics Of Surface I\"
  • D.P.Wooduff, T.A.Delchar : Modern Techniques of Surface Science (1986) Cambridge University Press
  • Surface Crystallography (1985). John Wiley & Sons
  • M.A. van Hove, S.Y.Tong : Surface Crystallography by LEED (1979) Springer
  • Springer Series in Chemical Physics vol.35 \" Chemistry and Physics of Solid Surfaces - V.\" Springer 1984
  • A.M.Afanasjev, P.A.Alexandrov, R.M.Imamov : Rentgenodifrakcionnaja diagnostika submikronnych slojev. (1989) Nauka. Moskva

články v časopisechu a kol. : Analytical Techniques for Thin Films New York 1986

  • H.Oeschner : Thin Films and Depth Profile Analysis. Springer Verlag 1984
  • K.H.Rieder : \"Experimental Methods for Determining Surface Structures and Surface Corrugations\" v Topics in Current Physics vol.41 - \"Structure and Dynamics Of Surface I\"
  • D.P.Wooduff, T.A.Delchar : Modern Techniques of Surface Science (1986) Cambridge University Press
  • Surface Crystallography (1985). John Wiley & Sons
  • M.A. van Hove, S.Y.Tong : Surface Crystallography by LEED (1979) Springer
  • Springer Series in Chemical Physics vol.35 \" Chemistry and Physics of Solid Surfaces - V.\" Springer 1984
  • A.M.Afanasjev, P.A.Alexandrov, R.M.Imamov : Rentgenodifrakcionnaja diagnostika submikronnych slojev. (1989) Nauka. Moskva

články v časopisech

Requirements to the exam - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Syllabus -
Last update: T_KFES (26.05.2003)

A. SURFACE STRUCTURE

Importance of surface structure study. Surface relaxation and reconstruction. 2D Bravais lattices. Wood´s notation. Matrix notation. Steps and facets. Surface structures. Diffraction on 2D lattice. Ewald construction. Diffracting beam description.

B. METHODS OF STUDY OF SURFACE STRUCTURES AND THIN FILMS

Methods of clean surface preparation.

1. Diffraction of electrons and positrons.

LEED - basic characteristics and principle, experimental setup, electron scattering in crystal, mutliple scattering, surface lattice defects, phase transitions.

Thermal vibrations. Debye-Waller factors. Anisotropic vibrations.

MEED, RHEED, LEPD - principles and applications.

2. Scattering of atoms and ions.

Diffraction of atoms - interaction of atoms with surface, experimental setup, applications (charge density distribution, hydrogen chemisorption, reconstruction, surfaces of insulators, incommensurate structures)

Ion scattering (ISS) - LEIS, MEIS, HEIS (RBS). Principles, peak intensity, study of atomic displacements, reconstructed and relaxed surface, adsorbates, interfaces, surface melting)

3. Spectroscopic methods

  • UPS, XPS, AES (structure information)
  • SEXAFS, NEXAFS Principles, study of local structure in disordered materials, study of bonding and orientation of adsorbed molecules, coordination numbers, chemisorption, interface solid-thin film).

4. Some other methods (ESDIAD, TSD, HREELS, ...)

5. Microscopy of surfaces

  • FEM (principle, tunneling, experimental setup, resolution, applications
  • FIM (principle, setup, resolution, atomic imaging)
  • STM (discovery, development, principle, modes of measurement, resolution, setup, applications)
  • HRTEM (basic differences from conventional TEM)

6. X-ray diffraction

Double- and triple crystal diffractometry (diffraction in perfect crystals, epitaxial layers - strains, composition, depth profiling)

Glancing angle diffraction - total reflection, amorphous thin films, implanted films, surfaces. GID - grazin angle diffraction.

Standing-wave method (secondary radiation, registration of photoelectrons, fotoemission, fluorescence, Compton scattering)

Study of polycrystalline thin films. Structural pecularities of thin films, mechanical properties. Conventional powder diffraction (pahse analysis, texture, stress, strain, crystallite size). Stress determination. Low-angle diffraction. Examples, hard coatings.

 
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