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Course, academic year 2018/2019
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Atomic Resolution Electron Microscopy - NFPL079
Title in English: Elektronová mikroskopie s atomovým rozlišením
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2004
Semester: winter
E-Credits: 3
Hours per week, examination: winter s.:2/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Guarantor: prof. RNDr. Miroslav Karlík, Dr.
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFK (17.04.2002)
Interaction between electrons and crystal, wavefunction calculation - multislice procedure and Blochwave, theory of imaging in electron microscope, contrast transfer function, image simulation and interpretation of images with atom resolution - software EMS, experimental conditions of image acquiring with atom resolution.
Literature - Czech
Last update: T_KFK (17.03.2004)

1. KARLÍK, M. (2001) Lattice imaging in transmission electron microscopy, Materials Structure, 8, 2001, 3-15.

2. WILLIAMS D.B., CARTER C.B. Transmission Electron Microscopy, Plenum Press, New York, 1996.

3. REIMER, L., Transmission Electron Microscopy, Springer-Verlag, 1989.

4. STADELMANN, P. A., EMS - A software package for electron diffraction analysis and HREM image simulation in materials science, Ultramicroscopy 21, 1987, 131-146.

Syllabus -
Last update: T_KFK (17.04.2002)

1) Electron-crystal interactions Schrödinger equation and crystal potential, low angle scattering approximation, projected potential approximation, wavefunction calculation 2) Contrast transfer Impulse response and transfer function, scalar theory of diffraction - Fresnel and Fraunhofer approximation, real electron lenses and their aberrations, partial coherency of the electron beam 3) Interpretation of micrographs - simulations Software EMS : construction of a crystal model, phase object function, Fresnel propagator, image and contrast transfer, PostScript output 4) Practical conditions of HREM Crystal orientation and thickness, astigmatism and coma-free correction, size of the objective aperture 5) Sample preparation Electrolytical polishing, ion polishing, cleavage, electrochemical deposition, sputtering, evaporation,

Literature : KARLÍK, M. (2001) Lattice imaging in transmission electron microscopy, Materials Structure, 8, 2001, 3-15. WILLIAMS D.B., CARTER C.B. Transmission Electron Microscopy, Plenum Press, New York, 1996. REIMER, L., Transmission Electron Microscopy, Springer-Verlag, 1989. STADELMANN, P. A., EMS - A software package for electron diffraction analysis and HREM image simulation in materials science, Ultramicroscopy 21, 1987, 131-146.

 
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