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The course is focused on key experimental techniques for studying electronic structure and surfaces of solid
materials. Relevant theoretical models are also discussed. First the concept of electron theory in condensed matter
and fundamentals of electromagnetic field - matter interaction are introduced. Next, important classes of
experimental methods are discussed: photoelectron spectroscopies, scanning probe microscopies, surface
diffraction methods, angle-resolved methods, and spin selective methods. The course is completed with a series of
examples on real materials. (Alternative to MC240P92
Last update: Mikšová Kateřina, Mgr. (02.02.2022)
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The condition for completing the course is successfully passing the exam according to the requirements Last update: Mikšová Kateřina, Mgr. (12.05.2022)
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A.V. Zotov, K. Oura, M. Katayama, and V.G. Lifshits, Surface Science: An Introduction, Springer 2003. H. Ibach, Physics of Surfaces and Interfaces, pringer Science & Business Media, 2006. B. Voigtländer, Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy, Springer Berlin Heidelberg, 2015. S. Hufner, Photoelectron Spectroscopy: Principles and Applications, Springer-Verlag, 1995. S. Suga and A. Sekiyama, Photoelectron Spectroscopy: Bulk and Surface Electronic Structures, Springer Berlin Heidelberg, 2013. N. Ashcroft, N. Mermin, Solid State Physics, Academic Press, Jun 17, 1991. Ch. Kittel, Introduction to solid state physics, John Willey & Sons, Inc., 2005. Relevant research articles. Last update: Mikšová Kateřina, Mgr. (02.02.2022)
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Oral exam on the topics discussed in the course (as defined in the sylabus). Last update: Mikšová Kateřina, Mgr. (03.02.2022)
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Basic concept of electron theory in solids (reciprocal space, Bloch theorem, band structure, Fermi surface) Interaction of electromagnetic field with solids (absorption, diffraction, Fermi golden rule) Photoelectron Spectroscopies and Microscopies (X-ray and Ultraviolet Photoemission Spectroscopy, PE Electron Microscopy) Scanning Probe Microscopy (Atomic Force Microscopy, Magnetic Force Microscopy, Scannin Tunelling Microscopy, Kelvin Probe Microscopy, Piezoresponse Force Microscopy) Surface diffraction techniques (Low Energy Electron Diffraction, Reflection High-Energy Electron Diffraction) Angle-resolved experiments (Angle Resolved PES, de Haas van Alphenův jev, cyklotronová rezonance) Spin selective methods (Spin Resolved AR PES, X-Magnetic Circular Dichroism) Characterization of selected materials (2D crystals - graphene, nanoparticles, nanoporous materials, magnetics, semiconductors, nanostructured surfaces) Last update: Mikšová Kateřina, Mgr. (07.02.2022)
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