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Course, academic year 2018/2019
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Practical Applications of Transmission Electron Microscopy - NFPL074
Title in English: Praktické užití transmisní elektronové mikroskopie
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2014
Semester: both
E-Credits: 4
Hours per week, examination: 0/3 C [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Note: you can enroll for the course repeatedly
you can enroll for the course in winter and in summer semester
Guarantor: doc. RNDr. Josef Pešička, CSc.
prof. RNDr. Miloš Janeček, CSc.
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFK (17.04.2002)
Special seminar for undergraduate students of grade 4. The attendance of the seminar is required for students who intend to use electron microscope Jeol 2000 FX for their diploma thesis. Preparation of thin foils, the operation of the electron microscope, the observation of real structures, the use of image analysis in evaluation of TEM micrographs. The tuition will be adjusted according to the particular student´s needs in the diploma thesis.
Literature - Czech
Last update: T_KFK (17.03.2004)

1. B. Smola: Transmisní elektronová mikroskopie. Skripta MFF UK, Státní pedagogické nakladatelství, Praha 1983.

2. L. Reimer: Transmission Electrom Microscopy. Springer Verlag, Berlín 1993.

3. J.W. Edington: Practical Electron Microscopy in Materials Science. ed. N.v. Philips Gloeilampenfabrieken, Eindhoven 1976.

4. I.M. Watt: The Principle and Practice of Electron Microscopy. Cambridge University Press, London 1985.

5. F. Jandoš, R. Říman, A. Gemperle: Využití moderních laboratorních metod v metalografii. Nakladatelství technické literatury, Praha 1985.

6. Williams D.B., Carter C.B. Transmission Electron Microscopy, Plenum Press, New York, 1996.

Syllabus -
Last update: T_KFK (13.03.2003)

1. The electrolytic preparation of foils for transmission electron microscope observation by means of device Tenupol.

2. Description and operation of the JEOL 2000 FX electron microscope, basic centering procedure.

3. The observation of the defects in the crystal structure (dislocations, stacking faults, grain boudaries, ?), the observation of the particles and their analysis, phase analysis, using the X-rays to determination of composition, diffraction patterns, Kikuchi lines.

4. Application of image analysis at exploation of electron micrographs.

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