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Course, academic year 2018/2019
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Seminar on Analytical Methods in Electron Microscopy - NFPL054
Title in English: Seminář analytických metod v elektronové mikroskopii
Guaranteed by: Department of Physics of Materials (32-KFM)
Faculty: Faculty of Mathematics and Physics
Actual: from 2016
Semester: both
E-Credits: 6
Hours per week, examination: 0/4 C [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: English
Teaching methods: full-time
Note: you can enroll for the course in winter and in summer semester
Guarantor: prof. RNDr. Miloš Janeček, CSc.
doc. RNDr. Bohumil Smola, CSc.
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFK (17.04.2002)
Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques. For undergraduate students of grade 4 and 5 and graduate students.
Literature - Czech
Last update: T_KFK (17.03.2004)

1. B. Smola: Transmisní elektronová mikroskopie. Skripta MFF UK, Státní pedagogické nakladatelství, Praha 1983.

2. L. Reimer: Transmission Electrom Microscopy. Springer Verlag, Berlín 1993.

3. J.W. Edington: Practical Electron Microscopy in Materials Science. ed. N.v. Philips Gloeilampenfabrieken, Eindhoven 1976.

4. I.M. Watt: The Principle and Practice of Electron Microscopy. Cambridge University Press, London 1985.

5. F. Jandoš, R. Říman, A. Gemperle: Využití moderních laboratorních metod v metalografii. Nakladatelství technické literatury, Praha 1985.

6. Williams D.B., Carter C.B. Transmission Electron Microscopy, Plenum Press, New York, 1996.

Syllabus -
Last update: T_KFK (17.03.2004)

Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques.

For undergraduate students of grade 4 and 5 and graduate students.

 
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