SubjectsSubjects(version: 861)
Course, academic year 2019/2020
  
X-ray methods for structure and microstructure investigation of materials - NFPL030
Title: Rtg metody studia struktury a mikrostruktury materiálů
Guaranteed by: Department of Condensed Matter Physics (32-KFKL)
Faculty: Faculty of Mathematics and Physics
Actual: from 2015
Semester: summer
E-Credits: 5
Hours per week, examination: summer s.:2/1 C+Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Additional information: http://krystal.karlov.mff.cuni.cz/FPL030
Note: course can be enrolled in outside the study plan
enabled for web enrollment
Guarantor: prof. RNDr. Radomír Kužel, CSc.
doc. RNDr. Stanislav Daniš, Ph.D.
Classification: Physics > Solid State Physics
Annotation -
Last update: T_KFES (14.05.2014)
X-Ray generators, detectors. Monochromatization. Basic single crystal methods. Film powder methods. Different diffraction geometries. Powder diffraction pattern and its evaluation Identification of unknown phases - qualitative and quantitative phase analysis. Precise measurement of lattice parameters. Rietveld method. Basic methods for texture and stress analysis. XRD profile analysis. Methods of structure solution. Structure of amorphous materials. Modern methods of X-ray imaging.
Course completion requirements - Czech
Last update: prof. RNDr. Radomír Kužel, CSc. (14.06.2019)

Předmět je zakončen ústní zkouškou. Podmínkou pro připuštění ke zkoušce je zápočet. K zápočtu je nutné absolvovat praktické úlohy ve cvičeních.

Literature - Czech
Last update: RNDr. Pavel Zakouřil, Ph.D. (05.08.2002)

V. Valvoda, M. Polcarová, P. Lukáč : Základy strukturní analýzy. Karolinum. Praha. 1992.

I. Kraus : Úvod do strukturní rentgenografie. Academia. Praha 1985.

I. Kraus., V.V. Trofimov : Rentgenová tenzometrie. Academia. Praha 1988. Quantitative Texture Analysis. ed. H.J. Bunge, C. Esling. DGM. Oberursel. 1982.

Experimentální techniky v rentgenové a neutronové strukturní analýze. Krystalografická společnost. Praha 1994. ed. R. Kužel.

Difrakcia na polykryštalických látkach.R & D. Print. Bratislava. 1994. red. L. Smrčok.

dále vybrané články z časopisů.

Syllabus -
Last update: T_KFES (26.05.2003)

1. X-ray sources Laboratory sources, rotation anodes, synchrotron radiation, neutron sources

2. Monochromatization Filters, monochromators

3. Detection of radiation Films, point, linear, area detectors

4. Single crystal methods Film methods - Laue (orientation of crystal), Weissenberg, rotating crystal, precession Difractometers - Eulerian cradle, kappa geometry

5. Film powder methods - Debye-Scherrer methods, Guinier

6. Information in powder diffraction pattern. Basic methods of powder diffraction - structure refinement, qualitative and quantitative phase analysis, study of lattice parameters, thermal vibrations, crystallite size and strain.

7. Powder diffraction pattern - data reduction. Determination of line profile parameters by the direct method and fitting.

8. Diffraction geometries. Conventional powder method, psi and omega goniometers, Seemann-Bohlin goniometer, influence of instrumental factors and absorption, penetration depth

9. Phase identification

10. Qualitative and qunatitative phase analysis

11. Lattice parameters

12. Rietveld method and structure refinement

13. Residual stress determination Classification of stresses, stress description, sin^2 psi method. Stress measurements

14. Textures ODF, texture measurements with texture goniometer, fiber textures and their characterization with conventional diffractometer (psi and omega scans)

15. Line profile analysis Correction on instrumental broadening, size-strain separation.

16. Study of size, shape and distribution of crystallites in the range of 5 nm - 10000 nm.

17. Study of amorphous materials Diffraction and EXAFS

18. Basic methods of structure solution Patterson methods, heavy-atom method. Direct methods.

 
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