SubjectsSubjects(version: 845)
Course, academic year 2018/2019
   Login via CAS
X-ray Scattering on Thin Films - NFPL013
Title in English: Rozptyl rtg záření na tenkých vrstvách
Guaranteed by: Department of Condensed Matter Physics (32-KFKL)
Faculty: Faculty of Mathematics and Physics
Actual: from 2017 to 2019
Semester: winter
E-Credits: 3
Hours per week, examination: winter s.:2/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: English
Teaching methods: full-time
Additional information: http://krystal.karlov.mf.cuni.cz/FPL013
Guarantor: prof. RNDr. Václav Holý, CSc.
Annotation -
Last update: HOLY (17.05.2007)
Theoretical description and experimental applications of high-resolution x-ray scattering for structural investigations of single-crystalline thin layers and superlattices. Theoretical background of the method is formulated including the elements of kinematical and dynamical scattering theories and several models of a real structure of a thin single-crystalline layer. Recent results of small angle x-ray scattering from randomly rough interfaces, x-ray diffraction and diffuse scattering from crystalline thin layers with structure defects and from self-organized quantum dots.
Course completion requirements - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Zkouška se sestává z písemné a ústní části. Písemná část spočívá ve vyřešení velmi snadného problému, který nevyžaduje dlouhé počítání (max. 30 min). Ústní část navazuje na řešení zmíněného problému a trvá max. 45 min. Známka zkoušky se stanoví ze souhrnného hodnocení písemné a ústní části. Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Literature - Czech
Last update: T_KFES (23.05.2003)

V. Holý, U. Pietsch and T. Baumbach, High-Resolution X-Ray Scattering From Thin Films and Multilayers, Springer-Verlag Berlin, Heidelberg, New York 1999.

H. N. Yang, G. C. Wang and T. M. Lu, Diffraction from Rough Surfaces and Dynamic Growth Fronts, World Scientific Singapore 1993.

Requirements to the exam - Czech
Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)

Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu.

Syllabus -
Last update: T_KFES (23.05.2003)
FPL013

1. Experimental aspects of high-resolution x-ray scattering

X-ray monochromators and analyzing crystals, reciprocal space maps of scattered intensity, resolution function of a diffractometer, various scattering geometries: coplanar (XRR, XRD), non-coplanar (GISAXS, GID, GICE)

2. Basic description of a wave field

An x-ray wave in vacuum, the Green function of a free particle, the Weyl representation, scattering of a wave field, differential scattering cross-section, directions of the waves scattered from a perfect, laterally infinite layer

3. Theory of kinematical scattering from ideal layers

Scattering from an ideal small crystal in the Fraunhofer approximation, scattering from a laterally infinite thin layer, x-ray reflection, x-ray diffraction, empirical refraction and absorption corrections

4. Kinematical x-ray scattering from disturbed thin layers

Homogeneous deformation, pseudomorph and relaxed layers, periodic superlattices, random deformation, coherent and incoherent (diffuse) scattering

5. Dynamical x-ray scattering

Equations for the amplitudes, dispersion surface, boundary conditions at the crystal surface, one-beam approximation, x-ray reflection, two-beam approximation, x-ray diffraction, n-beam diffraction, non-coplanar diffraction, semi-kinematical approximation, method DWBA

6. Measurement of basic structural parameters of thin layers

Thickness of a thin layer and multilayer, elastic and plastic deformation in thin layers, determination of the degree of plastic relaxation by x-ray diffraction, study of surface reconstruction by GID

7. X-ray reflection from rough interfaces

Statistical model of a rough interface, fractal and non-fractal roughness, growth models of a rough surface, EW and KPZ equations, coherent reflection from rough interfaces, diffuse reflection from rough interfaces

8. Diffuse scattering from volume defects in thin layers

Classification of defects, strong and weak defects, diffuse scattering from precipitates, diffuse scattering from dislocations, mosaic structure model

9. X-ray scattering from self-organized structures

Mechanisms of a self-organizing growth, a phenomenological model of a self-organized structure, small-angle scattering: XRR, GISAXS, x-ray diffraction: XRD, GID
 
Charles University | Information system of Charles University | http://www.cuni.cz/UKEN-329.html