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Course, academic year 2019/2020
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Methods of Physics of Surfaces and Thin Films II - NEVF516
Title in English: Metody fyziky povrchů a tenkých vrstev II
Guaranteed by: Department of Surface and Plasma Science (32-KFPP)
Faculty: Faculty of Mathematics and Physics
Actual: from 2017 to 2019
Semester: winter
E-Credits: 3
Hours per week, examination: winter s.:2/0 Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech, English
Teaching methods: full-time
Guarantor: doc. RNDr. Pavel Sobotík, CSc.
doc. RNDr. Ivan Ošťádal, CSc.
Class: DS, fyzika povrchů a rozhraní
Classification: Physics > Surface Physics and P. of Ion.M.
Annotation -
Last update: G_F (12.10.2001)
Physical principles of near field scanning probe microscopy techniques. Scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related techniques. Application, limits of resolution and imaging, comparison with other methods for surface analysis. Exclusively for postgraduate study.
Course completion requirements - Czech
Last update: doc. RNDr. Jiří Pavlů, Ph.D. (14.06.2019)

Podmínkou zakončení předmětu je úspěšné složení zkoušky.

Literature -
Last update: T_KEVF (23.05.2008)

Güntherodt H.-J. and Wiesendanger R., Scanning Tunneling Microscopy I (General Principles and Applications to Clean and Adsorbate Covered Surfaces), 2nd. ed., Springer Series in Surf. Sci. 20, Springer Verlag, Berlin, Heidelberg, 1994

Wiesendanger R. and Güntherodt H.-J., Scanning Tunneling Microscopy II (Further Applications and Related Scanning Techniques), 2nd. ed., Springer Series in Surf. Sci. 28, Springer Verlag, Berlin, Heidelberg, 1995

Wiesendanger R. and Güntherodt H.-J., Scanning Tunneling Microscopy III (Theory of STM and Related Scanning Probe Methods), Springer Series in Surf. Sci. 29,Springer Verlag, Berlin, Heidelberg, 1993

Bai Ch., Scanning Tunneling Microscopy and its Application, Springer Series in Surf.Sci. 32, Springer Verlag, Berlin, Heidelberg, N.Y., 1992

Stroscio J. A. and Kaiser W. J., Scanning Tuneling Microscopy, Methods of Experimental Physics 27, Academic Press, Boston, 1993

Requirements to the exam - Czech
Last update: doc. RNDr. Jiří Pavlů, Ph.D. (14.06.2019)

Zkouška je ústní, tvoří ji dvě otázky v souladu se sylabem přednášky. Požadované znalosti odpovídají rozsahu odpřednášené problematiky

Syllabus -
Last update: T_KEVF (23.05.2008)


Review of microscopy techniques (transmission electron m. - TEM, scanning electron m. - SEM, field electron m. - FEM, field ion m. - FIM, low energy electron m. - LEEM), physical principles, modifications; characterizations of near field scanning probe microscopies (SPM).


Physical principle of scanning tunneling microscopy (STM), modes of imaging, resolution limits, tunneling, spectroscopy of tunneling electrons; scanning tunneling spectroscopy (STS); construction of STM , basic problems of SPM construction; comparison of STM and other "classical" microscopy techniques.


STM and related techniques: scanning tunneling potentiometry, scanning noise microscopy (SNM), ballistic electron emission microscopy (BEEM) and spectroscopy (BEES), scanning capacitance microscopy (SCM), scanning tunneling thermometer.


Physical principles of scanning force microscopies (SFM): atomic force microscopy (AFM), magnetic force m. (MFM), electric force m. (EFM) and imaging techniques:

(a) DC contact techniques: constant force mode, constant height mode, error mode, imaging of lateral forces, spreading resistance imaging.

(b) AC contact techniques: force modulation mode, contact EFM, acoustic AFM (AFAM), AFAM resonance spectroscopy.

(c) semi-contact techniques: semi-contact mode, phase imaging, semi-contact error mode.

(d) non-contact techniques: non-contact mode, frequency modulation mode.

(e) many-pass techniques: EFM, capacitance microscopy, Kelvin probe microscopy, DC MFM, AC MFM, dissipation force microscopy.

Spectroscopies: force-distance, adhesion force imaging, amplitude-distance, phase-distance, frequency-distance, full resonance spectroscopy.


Scanning near field optical microscopy (SNOM), physical principle. Shear Force Microscopy. Imaging modes: transmission, reflection, luminescence.

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