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Introduction into study of fluctuations in simple physical systems and electronic elements. Types of electrical noise (thermal, shot, generation-recombination, burst, excess - 1/f). Fluctuations - source of information on system dynamics. Measurability and measurement of electrical quantities and noise, methods of data processing.
Last update: T_KEVF (12.05.2005)
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Podmínkou zakončení předmětu je úspěšné složení zkoušky, tj. hodnocení zkoušky známkou "výborně", "velmi dobře" nebo "dobře". Zkouška musí být složena v období předepsaném harmonogramem akademického roku, ve kterém student předmět zapsal. Last update: Pavlů Jiří, doc. RNDr., Ph.D. (14.06.2019)
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A. van der Ziel, History of Noise Research, Advances in Electronics, 50 (1980) 351-409. A. van der Ziel, Noise in Measurements, J. Willey &sons, N.Y., London, Toronto, Sydney, 1976. M. J. Buckingham, Noise in Electronic devices and Systems, J. Willey & sons, N.Y., Chichester, 1983. D. A. Bell, Noise and the Solid State, Pentech Ltd, London, 1985. D. A. Bell, Electrical Noise, van Nostrad, London, 1960. R. Serra, M. Andretta, M. Compiani and G. Zanarini, Introduction to the physics of complex systems, Pergamon Press, N.Y., London, 1986. Last update: T_KEVF (12.05.2005)
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Zkouška je ústní, dvě otázky vycházejí ze sylabu přednášky a požadované znalosti odpovídají odpřednášenému rozsahu. Last update: Ošťádal Ivan, prof. RNDr., CSc. (07.06.2019)
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1. Mathematical basics - processing of measured quantities, sampling, Fourier transform, time and frequency filters, digital filtering.
2. Fluctuation of physical quantities, relaxations, noise. Mathematical description of fluctuations, basic theorems.
3. Noise - undesirable phenomenon, source of information. Noise and measurements - signal detection, sensitivity, noise, limits of measurements. Analog and digital measurements. Synchro-detection.
4. Electrical noise at charge transport and emission in simple systems. Noise: thermal, shot, generation -recombination, burst, flicker - 1/f. Noise figure, equivalent noise resistance. Noise in vacuum, semiconductor, low temperature and laser electronic elements. Noise measurements - methods.
5. Noise in thin films physics - contemporary questions and subjects of interest. Last update: T_KEVF (12.05.2005)
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