|
|
|
||
|
Auger Electron Spectroscopy (AES) Energy Loss Spectroscopy (ELS) a Photoelectron Spectroscopy (XPS, UPS), Inverse photoemission.
Last update: T_KEVF (15.05.2005)
|
|
||
|
Získání zápočtu je podmínkou pro konání zkoušky. Udělení zápočtu je podmíněno průběžnou účastí na výuce, aktivitou při cvičeních a vypracováním zjednodušeného protokolu z měření. Povaha kontroly studia předmětu vylučuje opakování zápočtu. Last update: Pavlů Jiří, doc. RNDr., Ph.D. (04.06.2020)
|
|
||
|
J. M. Walls (ed.): Methods of Surface Analysis, Cambridge University Press, Cambridge, 1990. D. Briggs, J. T. Grant (ed.): Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, The Cromwell Press, Trowbridge, 2003. G. Ertl, J. Küppers: Low Energy Electrons and Surface Chemistry, VCH Verlagsgesellschaft mbH, Weinheim, 1985. Stefan Hüfner: Photoelectron Spectroscopy: Principles and Applications, Springer Science & Business Media, 2003 L. Eckertová (ed.): Metody analýzy povrchu - elektronová spektroskopie, Akademia Praha, 1990. Last update: T_KEVF (13.05.2017)
|
|
||
|
Examination is oral. Scope of the examination corresponds to the sylabus to the extent presented at the lectures. Last update: Johánek Viktor, doc. RNDr., Ph.D. (13.10.2017)
|
|
||
|
1. Basic principles
Methods overview, instrumentation (electron optics, radiation sources, analyzers, detectors), vacuum requirements (mean free path, influence of surface adsotrption, ...), samples (types, requrements, preparation methods), impact of radiation on surface compostion and structure and its elimination. 2. Electron transport in solids Elastic and inelastic interactions, interaction volume, attenuation depth, mean inelastic attenuation path, information depth. 3. Auger electron spectroscopy History, Auger de-excitation mechanism, experimental systems, qualitative analysis (energy and shape of Auger peaks), quantitative analysis (Auger emission intensity). 4. Energy loss spectroscopy EELS - instrumentation, ionization and plasmon losses, interband/intraband transitions, extended fine structure, adsorbate induced losses HREELS - instrumentation, electron scattering mechanism, examples of experimental results. 5. Photoelectron Spectroscopy History and common principles, photoionisation process, photoelectric effect. XPS - instrumentation, qualitative and quantitative analysis, initial and final state effects, angle resolved spectroscopy (ARXPS). UPS
resolved spectroscopy (ARUPS). Synchrotron-radiation based methods - SRPES, HAXPES, ARPES, RPES. IPE (Internal Photoemission Spectroscopy) - principle, instrumentation, applications. 6. Supplement (obsolete methods, state-of-the-art and modern versions of classical methods) Appearance potential spectroscopy (APS), Elastic peak electron spectroscopy (EPES), Two-photon photoemission spectroscopy (2PPE), Ion neutralization spectroscopy (INS), Field emission electron spectroscopy (FES), Near edge X-ray absorption fine structure (NEXAFS). El. spectroscopies in microscopic metods: EDX and WDX in SEM, TEM, STEM; LEEM (SPELEEM, IV char., energ. filter); STS in STM. Operando methods - NAP-XPS, NAP-PES. Last update: T_KEVF (15.05.2017)
|