SubjectsSubjects(version: 845)
Course, academic year 2018/2019
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Analysis Methods of Surfaces and Thin Layers - NBCM233
Title in English: Metody analýzy povrchů a tenkých vrstev
Guaranteed by: Department of Macromolecular Physics (32-KMF)
Faculty: Faculty of Mathematics and Physics
Actual: from 2018
Semester: winter
E-Credits: 5
Hours per week, examination: winter s.:2/1 C+Ex [hours/week]
Capacity: unlimited
Min. number of students: unlimited
State of the course: taught
Language: Czech, English
Teaching methods: full-time
Guarantor: doc. Ing. Andrey Shukurov, Ph.D., Ph.D.
Mgr. Jan Hanuš, Ph.D.
Mgr. Jaroslav Kousal, Ph.D.
Annotation -
Last update: T_KFES (14.05.2015)
Elelments of scanning probe microscopy. Resolution. Contact, semi-contact and non-contact measurement regimes. Advanced regimes of measuremen. AFM spectroscopy. Statistical analysis of surfaces.. X-ray photoelectron spectroscopy, method sources. Qualitative and quantitative analysis. Surface sensitivity. Auger electrons. Chemical shift.. Limitations of the method. Data evaluation. Surfaces and thin films vs. radiation in optical range. Significance of individual spectral ranges. Absorption and interference methd. Fourier spectroscopy. Reflection of polarized light, ellipsometry.
Course completion requirements -
Last update: doc. Ing. Andrey Shukurov, Ph.D., Ph.D. (07.06.2019)

Credit is granted for the participation and demonstration of the acquired theoretical knowledge in practice.

Literature -
Last update: doc. Ing. Andrey Shukurov, Ph.D., Ph.D. (07.06.2019)

V. L. Mironov, Fundamentals of Scanning Probe Microscopy, The textbook for students of the senior courses of higher educational institutions, 2004, p. 97.

D. Briggs, Surface analysis of polymers by XPS and static SIMS, 1998, p. 198.

Requirements to the exam -
Last update: doc. Ing. Andrey Shukurov, Ph.D., Ph.D. (07.06.2019)

The exam is oral. A systematic attendance is a condition for successful completion. Requirements for the exam correspond to the syllabus of the course to the extent that was presented at the lecture.

Syllabus -
Last update: doc. Ing. Andrey Shukurov, Ph.D., Ph.D. (07.06.2019)

Basics of scanning probe microscopy. Force interaction between tip and surface. Resolution and measurement artifacts. Contact, semi-contact and non-contact measurement modes. Advanced measurement modes (local electrical, viscoelastic and tribological properties). AFM spectroscopy. Statistical analysis of surfaces. X-ray photoelectron spectroscopy. Principle of the method, sources of X-rays, electron analyzer. Qualitative and quantitative analysis. Surface sensitivity. Auger electrons. Chemical shift. Method limitations. Data processing methods, CASA XPS analysis. Surfaces and thin films vs. radiation in the optical field. The importance of individual spectral fields. Absorption and interference methods. Fourier spectroscopy. Reflection of polarized light, principle of ellipsometry. Accuracy and sensitivity of ellipsometry, constraints. Ellipsometric analysis of optically non-trivial structures.

 
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