Thesis (Selection of subject)Thesis (Selection of subject)(version: 285)
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sort in descending ordersort in ascending orderTitle sort in descending ordersort in ascending orderYear of announcement sort in descending ordersort in ascending orderYear of defence Type of assignment Specialization sort in descending ordersort in ascending orderSupervisor sort in descending ordersort in ascending orderAuthor sort in descending ordersort in ascending orderAnnounced Assigned Department Faculty
detail Surface Characterization of Semiconductor Substrates for Optoelectronic Applications 2007/2008 Bachelor's thesis FOF doc. RNDr. Pavel Moravec, CSc.   05.10.2007 Ne Fyzikální ústav UK (32-FUUK) MFF
detail Surface Characterization of Semiconductor Substrates for Optoelectronic Applications 2006/2007 Bachelor's thesis FOF doc. RNDr. Pavel Moravec, CSc.   01.10.2006 Ne Fyzikální ústav UK (32-FUUK) MFF
detail Electric contacts in CdTe single crystals 2010/2011 Bachelor's thesis FOF doc. RNDr. Pavel Moravec, CSc.   01.10.2010 Ne Fyzikální ústav UK (32-FUUK) MFF
detail Study of the semiconductor surface roughness by means of an interferometer profiler 2009/2010 project FOF doc. RNDr. Pavel Moravec, CSc.   05.11.2009 Ne Fyzikální ústav UK (32-FUUK) MFF
detail Surface Characterization of Semiconductor Substrates for Optoelectronic Applications 2008/2009 Bachelor's thesis FOF doc. RNDr. Pavel Moravec, CSc.   03.10.2008 Ne Fyzikální ústav UK (32-FUUK) MFF
detail Electric contacts in CdTe single crystals 2009/2010 Bachelor's thesis FOF doc. RNDr. Pavel Moravec, CSc.   30.09.2009 Ne Fyzikální ústav UK (32-FUUK) MFF
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