Studium tenkých vrstev oxidů kovů pomocí rtg rozptylových metod
| Thesis title in Czech: | Studium tenkých vrstev oxidů kovů pomocí rtg rozptylových metod |
|---|---|
| Thesis title in English: | Study of thin metal-oxide layers by means of x-ray scattering methods |
| Key words: | rtg rozptyl|komplexní oxidy|oxidy kovů|tenké vrstvy|epitaxní vrstvy |
| English key words: | x-ray scattering|complex oxides|metal oxides|thin layers|epitaxial layers |
| Academic year of topic announcement: | 2021/2022 |
| Thesis type: | dissertation |
| Thesis language: | čeština |
| Department: | Department of Condensed Matter Physics (32-KFKL) |
| Supervisor: | Mgr. Lukáš Horák, Ph.D. |
| Author: | hidden - assigned and confirmed by the Study Dept. |
| Date of registration: | 28.07.2021 |
| Date of assignment: | 28.07.2021 |
| Confirmed by Study dept. on: | 15.09.2021 |
| Advisors: | RNDr. Milan Dopita, Ph.D. |
| Guidelines |
| 1. Studium doporučené literatury, rešerše současné odborné literatury (struktura vs vlastnosti tenkých oxidických vrstev)
2. Provedení laboratorních difrakčních experimentů na vzorcích různých jednovrstevných a vícevrstevných systémů oxidických vrstev za účelem určení jejich struktury a vyhodnocení mikrostrukturních parametrů. 3. Příprava a realizace (synchrotronových) experimentů s cílem určit strukturní změny na rozhraní mezi substrátem a vrstvou, resp. mezi sousedními vrstvami. 4. Adaptace a implementace fyzikálních modelů za účelem simulace experimentu a následné porovnání se získanými experimentálními (synchrotronovými) daty. |
| References |
| [1] U. Pietsch, V. Holý, and Tilo Baumbach, High-resolution X-ray scattering from Thin Films and Lateral Nanostructures, Second. New York: Springer, 2004.
[2] J. Als-Nielsen and D. McMorrow, Elements of Modern X-Ray Physics. New York: Wiley, 2001. [3] P. F. Fewster, X-ray Scattering From Semiconductors And Other Materials (3rd Edition), World Scientific, 2015 [4] B. E. Warren, X‐ray diffraction, Dover, New York, 1990 [5] A. M. Glazer, The classification of tilted octahedra in perovskites, Acta Cryst. B, 28: 3384-3392, 1972 [6] Y. Yacoby, et al., Direct structure determination of systems with two-dimensional periodicity. J. Phys. Condens. Matter 12, 3929–3938 (2000). |
| Preliminary scope of work in English |
| Thin metal-oxide layers refer to a variety of materials with wide spectrum of interesting properties for potential application, e.g. giant magnetoresistance, magnetostriction, ferroelectricity etc. These properties are quite often directly linked to the arrangement of oxygen atoms in the structure determining the symmetry, which is a common feature of these oxide compounds. In particular for thin layers, the symmetry and bond lengths can be effectively affected by the internal stress introduced by adjacent layer or substrate due to the different atomic periodicity along the interface. For example, the appropriately chosen substrate due to this strain allows to stabilize some high-pressure metastable phase of a given material (so called epitaxial stabilization). Further stacking of different compounds into layered system enables to couple the properties of the adjacent materials as well as tuning of the strain in its constituents (material tailoring). Therefore the structural characterization of individual layers and the interfaces is essential for the development of the tailored new functional materials. This work will be focused on the thorough study of the structure and the microstructure of metal oxide single-layers as well as complex oxide (multi-)layers. |