Optoelektronické a strukturní vlastnosti tenkých vrstev křemíku
| Thesis title in Czech: | Optoelektronické a strukturní vlastnosti tenkých vrstev křemíku |
|---|---|
| Thesis title in English: | Optoelectronic and structural properties of thin silicon films |
| Academic year of topic announcement: | 2003/2004 |
| Thesis type: | dissertation |
| Thesis language: | čeština |
| Department: | Fyzikální ústav AV ČR, v.v.i. (32-FZUAV) |
| Supervisor: | RNDr. Antonín Fejfar, CSc. |
| Author: | hidden - assigned and confirmed by the Study Dept. |
| Date of registration: | 25.11.2003 |
| Date of assignment: | 25.11.2003 |
| Date and time of defence: | 04.05.2009 11:00 |
| Date of electronic submission: | 04.05.2009 |
| Date of proceeded defence: | 04.05.2009 |
| Opponents: | doc. RNDr. Miroslava Trchová, CSc., DSc. |
| Prof. RNDr. Eduard Schmidt, CSc. | |