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Molecular and Ion Spectroscopy - NEVF148

Title:	Molekulová a iontová spektroskopie
Guaranteed by:	Department of Surface and Plasma Science (32-KFPP)
Faculty:	Faculty of Mathematics and Physics
Actual:	from 2020
Semester:	winter
E-Credits:	3
Hours per week, examination:	winter s.:2/0, Ex [HT]
Capacity:	unlimited
Min. number of students:	unlimited
4EU+:	no
Virtual mobility / capacity:	no
State of the course:	taught
Language:	Czech
Teaching methods:	full-time
Teaching methods:	full-time
Additional information:	https://physics.mff.cuni.cz/kfpp/rozvrh.html

Guarantor:	doc. RNDr. Jan Wild, CSc. doc. RNDr. Jiří Pavlů, Ph.D.

Opinion survey results Examination dates WS schedule Noticeboard

Annotation -

Last update: T_KEVF (21.03.2003)

Charge exchange between ions and surface, spectroscopy based on a principies of neutralization incident ions (INS) and ion scattering (ISS). Ion sputtering, depth profiling. Secondary ion mass spectroscopy (SIMS). Neutral particles scattering on the surfaces. Electron stimulated desorption.

Course completion requirements - Czech

Last update: doc. RNDr. Jiří Pavlů, Ph.D. (14.06.2019)

Podmínkou zakončení předmětu je úspěšné složení zkoušky, tj. hodnocení zkoušky známkou "výborně", "velmi dobře" nebo "dobře". Zkouška musí být složena v období předepsaném harmonogramem akademického roku, ve kterém student předmět zapsal.

Literature - Czech

Last update: T_KEVF (16.05.2005)

D.P. Woodruff, T.A. Delchar: Modern Techniques of Surface Science, University Press, Cambridge, Great Britain, 1986 .

L. Frank, J. Král (editors): Metody analýzy povrchů III: Iontové, sondové a speciální metody, ACADEMIA, Praha 2002.

Teaching methods -

Last update: doc. RNDr. Štěpán Roučka, Ph.D. (06.10.2020)

The lecture is conducted on-line in the winter semester 2020. For more information, see https://physics.mff.cuni.cz/kfpp/rozvrh.html

Requirements to the exam - Czech

Last update: doc. RNDr. Jiří Pavlů, Ph.D. (18.10.2017)

Zkouška probíhá ústně, otázky pokrývají sylabus v předneseném rozsahu.

Syllabus -

Last update: T_KEVF (16.05.2005)

1. Methods based on the ion impact

2. Charge exchange between ions and surface
Spectroscopy based on a neutralisation of incident ions (Ion Neutralisation Spectroscopy). Neutralisation by means of Auger transfer, deexcitation, experimental arrangement.

3. Ion scattering, methods based on it
Ion Scattering Spectroscopy and its modifications (LEIS, HEIS).

4. Ion sputtering, depth profiling
Collision cascade, sputtering yield, depth resolution.

5. Secondary Ion Mass Spectroscopy (SIMS)
Ion yield, energy spectrum of secondary ions, static and dynamical SIMS. Experimental arrangement.

6. Electronically Stimulated Desorption (ESD)
Principles, arrangement, detection. Time-of-flight and other analysis techniques.

7. Atomic and molecular beam scattering
Beam - surface interaction, elastic and non-elastic scattering, instrumentation.

8. Other methods based on the ion spectroscopy